Home > Jason Anderson > Physical Measurement and Analysis of Thin Films (Progress in Analytical Chemistry, Volume 2)
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Physical Measurement and Analysis of Thin Films (Progress in Analytical Chemistry, Volume 2) by Editor-E.M. Murt and W.G. Guldner
Price:
$2.82
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Book desription: Plenum Press, 1969. Hardcover. Very Good. HARDCOVER Stamps inside indicate it was once part of a corporate library. Besides these marks, the book is clean and tight, with no marks in the text. Ships out by next business day.
- Bookseller: Jason Anderson
(US)
- Bookseller Inventory #: T060828052
- Format/binding: Hardcover
- Book condition: Very Good
- Quantity available: 1
- Binding: Hardcover
- Publisher: Plenum Press
- Date published: 1969
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