Description:
Woodhead Publishing Limited , pp. xiii + 340 . Hardback. Used.
ELECTROMIGRATION IN THIN FILMS AND ELECTRONIC DEVICES -2011 by C.U. KIM
by C.U. KIM
Similar copies are shown below.
Similar copies are shown to the right.
Stock Photo: Cover May Be Different
ELECTROMIGRATION IN THIN FILMS AND ELECTRONIC DEVICES -2011
by C.U. KIM
- New
New/New. Brand New Original US Edition, Perfect Condition. Printed in English. Excellent Quality, Service and customer satisfaction guaranteed!
- Bookseller Students Textbooks (IN)
- Book Condition New New
- Jacket Condition New
- Quantity Available 1
- ISBN 10 1845699378
- ISBN 13 9781845699376
We have 4 copies available starting at $197.43.
Stock Photo: Cover May Be Different
Electromigration in Thin Films and Electronic Devices
- Used
- Hardcover
- Condition
- Used
- Binding
- Hardcover
- ISBN 13
- 9781845699376
- ISBN 10
- 1845699378
- Quantity Available
- 1
- Seller
-
Woodside, New York, United States
- Item Price
-
$197.43$3.99 shipping to
Show Details
Item Price
$197.43
$3.99
shipping to
Stock Photo: Cover May Be Different
Electromigration In Thin Films And Electronic Devices: Materials And Reliability
by Kim C-U
- New
- Hardcover
- Condition
- Brand New
- Binding
- Hardcover
- ISBN 13
- 9781845699376
- ISBN 10
- 1845699378
- Quantity Available
- 1
- Seller
-
New Delhi, India
- Item Price
-
$315.55FREE shipping to
Show Details
Description:
United States: Woodhead Publishing, 2011. Hardbound. Brand New. Book Condition:- Brand New. Secured Packaging. Fast DeliveryBookseller Inventory # 9781845699376
Item Price
$315.55
FREE shipping to
Stock Photo: Cover May Be Different
Electromigration In Thin Films And Electronic Devices: Materials And Reliability
by Kim C-U
- New
- Paperback
- Condition
- New
- Binding
- Paperback
- ISBN 13
- 9781845699376
- ISBN 10
- 1845699378
- Quantity Available
- 200
- Seller
-
New Delhi, Andaman and Nicobar Islands, India
- Item Price
-
$443.48$14.99 shipping to
Show Details
Description:
Woodhead Publishing, 2011. Paperback. New.
Item Price
$443.48
$14.99
shipping to
Stock Photo: Cover May Be Different
Electromigration In Thin Films And Electronic Devices: Materials And Reliability
by Kim C-U
- New
- Paperback
- Condition
- New
- Binding
- Paperback
- ISBN 13
- 9781845699376
- ISBN 10
- 1845699378
- Quantity Available
- 200
- Seller
-
New Delhi, India
- Item Price
-
$443.48$14.99 shipping to
Show Details
Description:
Woodhead Publishing, 2011. Paperback. New.
Item Price
$443.48
$14.99
shipping to