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ELECTROMIGRATION IN THIN FILMS AND ELECTRONIC DEVICES -2011 by C.U. KIM

by C.U. KIM

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ELECTROMIGRATION IN THIN FILMS AND ELECTRONIC DEVICES -2011 by C.U. KIM
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ELECTROMIGRATION IN THIN FILMS AND ELECTRONIC DEVICES -2011

by C.U. KIM

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New/New. Brand New Original US Edition, Perfect Condition. Printed in English. Excellent Quality, Service and customer satisfaction guaranteed!

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Electromigration in Thin Films and Electronic Devices
Stock Photo: Cover May Be Different

Electromigration in Thin Films and Electronic Devices

  • Used
  • Hardcover
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Used
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Hardcover
ISBN 13
9781845699376
ISBN 10
1845699378
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1
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Woodside, New York, United States
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Woodhead Publishing Limited , pp. xiii + 340 . Hardback. Used.
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Electromigration In Thin Films And Electronic Devices: Materials And Reliability
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Electromigration In Thin Films And Electronic Devices: Materials And Reliability

by Kim C-U

  • New
  • Hardcover
Condition
Brand New
Binding
Hardcover
ISBN 13
9781845699376
ISBN 10
1845699378
Quantity Available
1
Seller
New Delhi, India
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
$315.55
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Description:
United States: Woodhead Publishing, 2011. Hardbound. Brand New. Book Condition:- Brand New. Secured Packaging. Fast DeliveryBookseller Inventory # 9781845699376
Item Price
$315.55
FREE shipping to
Electromigration In Thin Films And Electronic Devices: Materials And Reliability
Stock Photo: Cover May Be Different

Electromigration In Thin Films And Electronic Devices: Materials And Reliability

by Kim C-U

  • New
  • Paperback
Condition
New
Binding
Paperback
ISBN 13
9781845699376
ISBN 10
1845699378
Quantity Available
200
Seller
New Delhi, Andaman and Nicobar Islands, India
Seller rating:
This seller has earned a 4 of 5 Stars rating from Biblio customers.
Item Price
$443.48
$14.99 shipping to

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Description:
Woodhead Publishing, 2011. Paperback. New.
Item Price
$443.48
$14.99 shipping to
Electromigration In Thin Films And Electronic Devices: Materials And Reliability
Stock Photo: Cover May Be Different

Electromigration In Thin Films And Electronic Devices: Materials And Reliability

by Kim C-U

  • New
  • Paperback
Condition
New
Binding
Paperback
ISBN 13
9781845699376
ISBN 10
1845699378
Quantity Available
200
Seller
New Delhi, India
Seller rating:
This seller has earned a 2 of 5 Stars rating from Biblio customers.
Item Price
$443.48
$14.99 shipping to

Show Details

Description:
Woodhead Publishing, 2011. Paperback. New.
Item Price
$443.48
$14.99 shipping to