Description:
Computer Society Press, 1988. hardcover in very good + condition.. Hardcover. Very Good.
Tutorial: Test Generation for Vlsi Chips by Ieee Computer Society - 1988-09-01
by Ieee Computer Society
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Tutorial: Test Generation for Vlsi Chips
by Ieee Computer Society
- Used
- good
1988-09-01. Good. Ships with Tracking Number! INTERNATIONAL WORLDWIDE Shipping available. May not contain Access Codes or Supplements. May be re-issue. May be ex-library. Shipping & Handling by region. Buy with confidence, excellent customer service!
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Books Express
(US)
- Book Condition Used - Good
- Quantity Available 1
- ISBN 10 081868786X
- ISBN 13 9780818687860
- Date Published 1988-09-01
We have 2 copies available starting at $21.38.
Stock Photo: Cover May Be Different
Test Generation for VLSI Chips
by Agrawal, Vishwani; Seth, Sharad C
- Used
- very good
- Hardcover
- Condition
- Used - Very Good
- Binding
- Hardcover
- ISBN 13
- 9780818687860
- ISBN 10
- 081868786X
- Quantity Available
- 1
- Seller
-
Vancouver, Washington, United States
- Item Price
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$21.38$6.50 shipping to
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Item Price
$21.38
$6.50
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Stock Photo: Cover May Be Different
Tutorial: Test Generation for Vlsi Chips
by Vishwani D. Agrawal et Sharad C. Seth
- Used
- good
- Hardcover
- Condition
- Used - Good
- Binding
- Hardcover
- ISBN 13
- 9780818687860
- ISBN 10
- 081868786x
- Quantity Available
- 1
- Seller
-
Morangis, France
- Item Price
-
$42.94$12.00 shipping to
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Description:
IEEE Computer Society, 1988. Hardcover. Good. Former library book. Slightly creased cover. Slight signs of wear on the cover. Stains on the edge. Different cover. Edition 1988. Ammareal gives back up to 15% of this item's net price to charity organizations.
Item Price
$42.94
$12.00
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