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Michael E. Iannucci Presents Ann Corio in This Was Burlesque

by Iannucci, Michael E.; Di Mona, Joe

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NEWARK, Ohio
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New York, NY, U.S.A.: Self Published/Michael E. Iannucci, 1966. Book. Very Good. Paperback. 1st. 4to - over 9¾ - 12" tall. Seller's image, know what you are getting! Pre-packing weight is 0 lb. 3.4 oz . ORIGINAL, NOT A REPRINT OR PHOTOCOPY!! Has NO Dust Jacket. Has light wear and soil to covers noted. Has NO Owner markings noted! See Picture! The Copyright date is NOT DATED but is Ca. 1966 for this Printing. This volume was purchased through local public sale. 11-3/4"H. x 9"W. Thank you for your purchase from Sunset Books! Help Promote World Literacy, GIVE a Book as a GIFT!! In stock, Ships from Ohio. WE COMBINE SHIPPING ON MULTIPLE PURCHASES!!!! SEE PICTURES!!!!! ANY ODD/GREEN TONES ON THE SCANS ARE CAUSED BY MY SCANNER!! All of our Technical/Textbook/Ex-Library volumes were obtained legally through Public or Auction sales. .
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la cage de cristal, HISTOIRES No. VIII: Flute SOLO with Piano accompaniment

la cage de cristal, HISTOIRES No. VIII: Flute SOLO with Piano accompaniment

by Ibert, Jacques (music); Moyse, Marcel (arrangement)

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Paris, France: Alphonse Leduc, 1932. Sheet music. Poor. Paperback. Folio - over 12 - 15" tall. Separate Flute and Piano sheets. Thank you for your purchase from Sunset Books! Help Promote World Literacy, GIVE a Book as a GIFT!! In stock, Ships from Ohio. WE COMBINE SHIPPING ON MULTIPLE PURCHASES!!!! FREE Media Mail SHIPPING within U.S.A. ON ALL SHEET MUSIC!! If a shipping charge appears on the invoice, it will be removed prior to our acceptance of the order, or refunded (SEE PICTURES) NO owner MARKINGS ON FRONT COVER, HAS markings in interior. 3 pages music, 3 pages other. Original copyright is 1932. 9.625" x 12.25". If you'd rather have an 8.5" x 11" copy of the music instead of the ORIGINAL, so indicate in your order. We will then scan and print on NEW 67 lb. cover stock on ink-jet printer. Allow 7 additional days for shipment of order for new printed copy at NO ADDITIONAL CHARGE. .
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CRC Handbook of LIE GROUP ANALYSIS OF DIFFERENTIAL EQUATIONS, Volume 1:  SYMMETRIES, EXACT...
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CRC Handbook of LIE GROUP ANALYSIS OF DIFFERENTIAL EQUATIONS, Volume 1: SYMMETRIES, EXACT SOLUTIONS AND CONSERVATION LAWS

by N. H. Ibragimov (Editor)

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Used - Good
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Hardcover
ISBN 13
9780849344886
ISBN 10
0849344883
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$89.00
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Boca Raton, FL, U.S.A.: CRC Press/The Chemical Rubber Co., 1994. Ex-Library. Good. Hardcover. 1st. 8vo. Light wear, soil. With full markings and pocket. RARE VOLUME!!! .
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ICIASF '87 RECORD: Proceedings of the 12th International Congress on Instrumentation in...
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ICIASF '87 RECORD: Proceedings of the 12th International Congress on Instrumentation in Aerospace Simulation Facilities. College of William and Mary; Williamsburg, VA; June 22-25, 1987

by ICIASF

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NEWARK, Ohio
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Piscataway, NJ, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1987. Ex-Library. Very Good. Hardcover. 1st. 4to. With full markings and pocket, Light wear, Light soil, IEEE Publication No. 87CH2449-7. Casebound, weight prior to packaging is 2 lb., 6.2 oz. If not for Library markings, volume would rate better. Little or next to no use!.
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ICIASF '83 RECORD: Proceedings of the International Congress on Instrumentation in Aerospace...
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ICIASF '83 RECORD: Proceedings of the International Congress on Instrumentation in Aerospace Simulation Facilities. St. Louis, France; September 20, 1983.

by ICIASF

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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1981. Ex-Library. Very Good. Hardcover. 1st. 4to. 304pp, w/full markings and pocket, wear, soil, IEEE Publication No. 83CH1954-7. Casebound, weight prior to packaging is 1 lb., 15.8 oz. If not for Library markings, volume would rate better. Little or next to no use!.
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ICIASF '85 RECORD: Proceedings of the 11th International Congress on Instrumentation in...
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ICIASF '85 RECORD: Proceedings of the 11th International Congress on Instrumentation in Aerospace Simulation Facilities. Stanford University, August 26-28, 1985.

by ICIASF

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  • very good
  • Hardcover
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Used - Very Good
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NEWARK, Ohio
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1985. Ex-Library. Very Good. Hardcover. 1st. 4to. With full markings and pocket, light wear, very light soil, IEEE Publication No. 85CH2210-3. Casebound, weight prior to packaging is 2 lb., 0.1 oz. If not for Library markings, volume would rate better. Little or next to no use!.
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$75.00
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ICIASF '79 RECORD: Proceedings of the 8th International Congress on Instrumentation in...
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ICIASF '79 RECORD: Proceedings of the 8th International Congress on Instrumentation in Aerospace Simulation Facilities. Naval Postgraduate School; Monterey, CA; September 24-26, 1979

by ICIASF

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NEWARK, Ohio
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1979. Ex-Library. Very Good. Hardcover. 1st. 4to. With full markings and pocket, Normal wear and soil, IEEE Publication No. 79CH1500-8..
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ICIASF '81 RECORD: Proceedings of the International Congress on Instrumentation in Aerospace...
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ICIASF '81 RECORD: Proceedings of the International Congress on Instrumentation in Aerospace Simulation Facilities. Dayton, OH; September 30, 1981.

by ICIASF

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  • very good
  • Paperback
  • First
Condition
Used - Very Good
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NEWARK, Ohio
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1981. Ex-Library. Very Good. Paperback. 1st. 4to. With full markings and pocket, light wear, light soil, IEEE Publication No. 81CH1712-9. Weight prior to packaging is 1 lb., 9.3 oz. If not for Library markings, volume would rate better. Little or next to no use!.
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Digital Image Recovery and Synthesis, Proceedings, Volume 828, 17-18 August 1987, San Diego, California, SPIE.

by Idell, Paul S. (Editor)

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  • very good
  • Paperback
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Used - Very Good
Edition
1st
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Paperback
ISBN 13
9780892528639
ISBN 10
089252863X
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NEWARK, Ohio
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$10.00
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Bellingham, WA, U.S.A.: SPIE PRESS-The International Society for Optical Engineering, 1987. Ex-Library. Very Good. Paperback. 1st. 4to. W/full markings and pocket. Wear, Soil. .
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '94), PROCEEDINGS OF IEEE INTERNATIONAL, 20-22 September 1994, Anaheim, California.

by IEEE

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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1994. Ex-Library. Very Good. Hard Cover. 1st Edition. 4to. W/full markings and pocket. IEEE CATALOG NUMBER 94CH34363. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library.
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '97), PROCEEDINGS OF IEEE INTERNATIONAL, 22-25...
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '97), PROCEEDINGS OF IEEE INTERNATIONAL, 22-25 September 1997, Anaheim, California.

by IEEE

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Used - Very Good
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1st Edition
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Hardcover
ISBN 13
9780780341630
ISBN 10
0780341635
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1997. Ex-Library. Very Good. Hard Cover. 1st Edition. 4to. W/full markings and pocket. IEEE CATALOG NUMBER 97CH36120. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library.
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '96), PROCEEDINGS OF IEEE INTERNATIONAL, 16-19...
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '96), PROCEEDINGS OF IEEE INTERNATIONAL, 16-19 September 1996, Dayton, Ohio.

by IEEE

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  • very good
  • Hardcover
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Condition
Used - Very Good
Edition
1st Edition
Binding
Hardcover
ISBN 13
9780780333802
ISBN 10
0780333802
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NEWARK, Ohio
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1996. Ex-Library. Very Good. Hard Cover. 1st Edition. 4to. W/full markings and pocket. IEEE CATALOG NUMBER 96CH35955. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library.
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '87), PROCEEDINGS OF IEEE INTERNATIONAL, 3-5 November 1987, San Francisco, California.

by IEEE

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  • very good
  • Hardcover
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Condition
Used - Very Good
Edition
1st Edition
Binding
Hardcover
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NEWARK, Ohio
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1987. Ex-Library. Very Good. Hard Cover. 1st Edition. 4to. W/full markings and pocket. IEEE CATALOG NUMBER 87CH25106. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library.
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '88), PROCEEDINGS OF IEEE INTERNATIONAL, 4-6 October 1988, Minneapolis, Minnesota.

by IEEE

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  • very good
  • Hardcover
  • First
Condition
Used - Very Good
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1st Edition
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Hardcover
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NEWARK, Ohio
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1988. Ex-Library. Very Good. Hard Cover. 1st Edition. 4to. W/full markings and pocket. IEEE CATALOG NUMBER 88CH25759. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library.
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '98), PROCEEDINGS OF IEEE INTERNATIONAL, 25-27...
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '98), PROCEEDINGS OF IEEE INTERNATIONAL, 25-27 August 1998, Salt Lake City, Utah.

by IEEE

  • Used
  • very good
  • Hardcover
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Condition
Used - Very Good
Edition
1st Edition
Binding
Hardcover
ISBN 13
9780780344211
ISBN 10
0780344219
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NEWARK, Ohio
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$42.00
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1998. Ex-Library. Very Good. Hard Cover. 1st Edition. 4to. W/full markings and pocket. IEEE CATALOG NUMBER 98CH36179. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library.
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$42.00
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AMERICAN CONTROL CONFERENCE, Proceedings of the 1983: Volumes 1-3, 22-24 Jun 1983, San Francisco, California, IEEE Catalog No. 83CH19158.

by IEEE

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  • good
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Condition
Used - Good
Edition
1st Edition
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Hardcover
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NEWARK, Ohio
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New York, NY, U.S.A.: The Institute of Electrical and Electronics Engineers Press, 1983. Ex-Library. Good. CASE BOUND. 1st Edition. 4to. 1350pp in 3 volumes, Has all standard Library markings, pocket, labels, stamps, wear and soil to covers. CLEAN TEXT. Thank you for your purchase from Sunset Books! Help Promote World Literacy, GIVE a Book as a GIFT!! In stock, Ships from Ohio. WE COMBINE SHIPPING ON MULTIPLE PURCHASES!!!! Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. .
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$77.00
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No image available

AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '90), PROCEEDINGS OF IEEE INTERNATIONAL, 17-20 September 1990, San Antonio, Texas.

by IEEE

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  • very good
  • Hardcover
  • First
Condition
Used - Very Good
Edition
1st Edition
Binding
Hardcover
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NEWARK, Ohio
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1990. Ex-Library. Very Good. Hard Cover. 1st Edition. 4to. W/full markings and pocket. IEEE CATALOG NUMBER 90CH27938. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library.
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '91), PROCEEDINGS OF IEEE INTERNATIONAL, 24-26...
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '91), PROCEEDINGS OF IEEE INTERNATIONAL, 24-26 September 1991, Anaheim, California.

by IEEE

  • Used
  • very good
  • Hardcover
  • First
Condition
Used - Very Good
Edition
1st Edition
Binding
Hardcover
ISBN 13
9780879425777
ISBN 10
0879425776
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NEWARK, Ohio
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1991. Ex-Library. Very Good. Hard Cover. 1st Edition. 4to. W/full markings and pocket. IEEE CATALOG NUMBER 91CH29413. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound Ex-Library.
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '89), PROCEEDINGS OF IEEE INTERNATIONAL, 25-28 September 1989, Philadelphia, Pennsylvania.

by IEEE

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  • very good
  • Hardcover
  • First
Condition
Used - Very Good
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1st Edition
Binding
Hardcover
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NEWARK, Ohio
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New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1989. Ex-Library. Very Good. Hard Cover. 1st Edition. 4to. W/full markings and pocket. IEEE CATALOG NUMBER 88CH25684. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library.
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IEEE PROJECT 802: LOCAL AREA NETWORK STANDARDS: Draft IEEE Standard 802.4 Token-Passing Bus Access Method and Physical Layer Specifications, Draft D December 1982,

by IEEE

  • Used
  • good
  • Paperback
  • First
Condition
Used - Good
Edition
1st
Binding
Paperback
Quantity available
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NEWARK, Ohio
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New York, NY, U.S.A.: IEEE; The Institute of Electrical and Electronics Engineers, Inc., 1982. Ex-Library. Good. Paperback. 1st. 4to. Vinyl comb binding! Seller's image, know what you are getting! Pre-packing weight is 1 lb. 4.2 oz . ORIGINAL, NOT A REPRINT OR PHOTOCOPY!! NO Dust Jacket. Has all standard Library markings, pocket, labels, stamps, wear and soil to covers. CLEAN TEXT! See Picture! The Copyright date is 1982 for this 1982 Printing. This volume was purchased through DMRO from the Wright-Patterson Technical Library in the late 1990's. EXTRA MEDIA MAIL SHIPPING WOULD BE REQUIRED BUT WILL NOT BE COLLECTED AS $2.00 OF PRICE IS FOR EXTRA POSTAGE! So it will ship at the One Book rate. Please consider this when comparing pricing! Thank you for your purchase from Sunset Books! Help Promote World Literacy, GIVE a Book as a GIFT!! In stock, Ships from Ohio. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. WE… Read More
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$19.00
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