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Failure Modes and Mechanisms in Electronic Packages
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Failure Modes and Mechanisms in Electronic Packages Hardcover - 1997

by P. Singh; Puligandla Viswanadham


From the publisher

Those of us who grew up in the "through-hole" age of electronic packaging are probably more amazed and appreciative than are our children at the incredible growth of electronic performance capability. My son, an electrical engineering student, seems almost to take for granted the innovations that leave me somewhat awestruck at times. Electronic circuit designers delight in packing more punch into less volume, while reminding us that their job has become increasingly challenging. The lay person also has learned from the media that the industry has been working wonders in shrinking the transistor and expanding the power of "the chip. " Much attention is focussed on the silicon and on the marvelous production and entertainment tools we now see in our offices and homes. Between the silicon and the end product lies the less publicized world of circuit-level packaging. We leave it to a cadre of technologists to take the schematics and parts lists and to develop the processes that tum the designers' concepts into physical reality. And while the silicon transistor is shrinking, the engineering challenges of packaging multiple chips and associated components into increasingly dense subsystems are growing. Further, the transistor may have to function without failure through severe industrial or military environments over the lifetime of the product.

Details

  • Title Failure Modes and Mechanisms in Electronic Packages
  • Author P. Singh; Puligandla Viswanadham
  • Binding Hardcover
  • Edition 1st
  • Pages 370
  • Volumes 1
  • Language ENG
  • Publisher Springer, New York
  • Date 1997-11-30
  • Illustrated Yes
  • ISBN 9780412105913 / 0412105918
  • Weight 1.54 lbs (0.70 kg)
  • Dimensions 9.02 x 6.38 x 1.03 in (22.91 x 16.21 x 2.62 cm)
  • Library of Congress subjects Electronic packaging - Defects, Semiconductors - Failures
  • Library of Congress Catalog Number 97026388
  • Dewey Decimal Code 005.18
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Failure Modes And Mechanisms In Electronic Packages
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Failure Modes And Mechanisms In Electronic Packages

by P. Singh; Puligandla Viswanadham

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Chapman & Hall, 1998. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:9780412105913
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Springer-Verlag Publishing, 1997. 1. Hardcover. Good. Good+; Hardcover; Withdrawn library copy with minimal library markings; Light wear to the covers; Library stamps to the endpapers; Text pages are clean & unmarked; Binding is excellent with a straight spine; This book will be stored and delivered in a sturdy cardboard box with foam padding; Medium Format (8.5” – 9.75” tall); Black covers with title in yellow lettering; 1997, Springer-Verlag Publishing; 370 pages; "Failure Modes and Mechanisms in Electronic Packages," by P. Singh & Puligandla Viswanadham.
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