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X-RAY DIFFRACTION BY DISORDERED LAMELLAR STRUCTURES: THEORY AND APPLICATIONS TO
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X-RAY DIFFRACTION BY DISORDERED LAMELLAR STRUCTURES: THEORY AND APPLICATIONS TO MICRODIVIDED SILICATES AND CARBONS Hardcover - 1990 - 1st Edition

by Drits, Victor A.; Tchoubar, Cyril


From the publisher

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.

Details

  • Title X-RAY DIFFRACTION BY DISORDERED LAMELLAR STRUCTURES: THEORY AND APPLICATIONS TO MICRODIVIDED SILICATES AND CARBONS
  • Author Drits, Victor A.; Tchoubar, Cyril
  • Binding Hardcover
  • Edition number 1st
  • Edition 1
  • Publisher Springer
  • Date 1990-11
  • ISBN 9783540512226