Backscattered Scanning Electron Microscopy and Image Analysis Of Sediments and Sedimentary Rocks
by David H Krinsley; Kenneth Pye; Jr, Sam Boggs; N Keith Tovey
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Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
by Krinsley, David H., Pye, Kenneth, Boggs Jr, Sam, Tovey, N. Keith
- Condition
- Used - Good
- ISBN
- 9780521453462
- Quantity Available
- 1
- Seller
-
Waltham Abbey, Essex, GBR
- Item Price
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$7.77
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Cambridge University Press. Used - Good. Ships from UK in 48 hours or less (usually same day). Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. 100% money back guarantee. We are a world class secondhand bookstore based in Hertfordshire, United Kingdom and specialize in… Read more about this item Item Price
$7.77
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
by David H. Krinsley; Kenneth Pye; Sam Boggs Jr; N. Keith Tovey
- Condition
- Used - Good
- Published
- 1998-07-13
- Binding
- Hardcover
- ISBN
- 9780521453462
- Quantity Available
- 1
- Seller
-
HOUSTON, Texas, USA
- Item Price
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$15.82
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Description:
Cambridge University Press, 1998-07-13. Hardcover. Good. Item Price
$15.82
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
by Krinsley, David H.; Pye, Kenneth; Boggs Jr, Sam; Tovey, N. Keith
- Condition
- New
- Binding
- Paperback
- ISBN
- 9780521019743
- Quantity Available
- 1
- Seller
-
campbelltown, Florida, USA
- Item Price
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$70.00
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Description:
Cambridge University Press. paperback. New. 7x0x9. Brand New Book in Publishers original Sealing Item Price
$70.00