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Springer, 2004. Hardcover. Very Good/No dustjacket as published. 8vo. pp. 496, ""Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of…
Applied Scanning Probe Methods I (NanoScience and Technology) by Bhushan, Bharat [Editor]; Fuchs, Harald [Editor]; Hosaka, Sumio [Editor];
by Bhushan, Bharat [Editor]; Fuchs, Harald [Editor]; Hosaka, Sumio [Editor];
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Applied Scanning Probe Methods I (NanoScience and Technology)
by Bhushan, Bharat [Editor]; Fuchs, Harald [Editor]; Hosaka, Sumio [Editor];
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- ISBN 10 3540005277
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Applied Scanning Probe Methods
by B. Bhushan,H. Fuchs,S. Hosaka
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APPLIED SCANNING PROBE METHODS I
by BHUSHAN, BHARAT; FUCHS, HARALD; HOSAKA, SUMIO ,
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Springer, 2004. 1st. Hardcover. New/New.
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Applied Scanning Probe Methods I
by S. Hosaka H. Fuchs B. Bhushan
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Springer , pp. 500 . Hardback. Used.
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