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Wiley & Sons, Incorporated, John. Used - Good. Used book that is in clean, average condition without any missing pages.
Semiconductor Material and Device Characterization by Schroder, Dieter K
by Schroder, Dieter K
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Semiconductor Material and Device Characterization
by Schroder, Dieter K
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Wiley-IEEE Press. hardcover. New. 6x2x9. Brand New Book in Publishers original Sealing
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- ISBN 10 0471739065
- ISBN 13 9780471739067
- Publisher Wiley-IEEE Press
- Size 6x2x9
- X weight 43 oz
- Size 6x2x9
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Semiconductor Material and Device Characterization
by Schroder, Dieter K
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- Used - Good
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Mishawaka, Indiana, United States
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Semiconductor Material and Device Characterization
by Dieter K. Schroder
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- Used - Very Good
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Seattle, Washington, United States
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Wiley & Sons, Incorporated, John, 2015. Hardcover. Very Good. Disclaimer:May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.Dust jacket quality is not guaranteed.
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Semiconductor Material and Device Characterization
by Schroder, Dieter K
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- Good
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- Used - Good
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- Hardcover
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- 9780471739067 / 0471739065
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Newport Coast, California, United States
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hardcover. Good. Access codes and supplements are not guaranteed with used items. May be an ex-library book.
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Semiconductor Material and Device Characterization
by Schroder, Dieter K
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- Hardcover
- ISBN 10 / ISBN 13
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San Diego, California, United States
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Wiley-IEEE Press, 2015-06-29. Hardcover. New. New. In shrink wrap. Looks like an interesting title!
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Semiconductor Material and Device Characterization
by Schroder, Dieter K
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- Hardcover
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- Used - Good
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- Hardcover
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Franklin Lakes, New Jersey, United States
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Wiley-IEEE Press, 2015-06-29. Hardcover. Good. Textbook, May Have Highlights, Notes and/or Underlining, BOOK ONLY-NO ACCESS CODE, NO CD, Ships with Tracking
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Semiconductor Material & Device Characterization 3/E 2006
by Schroder
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Houston, Texas, United States
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NEW. 100% BRAND NEW US HARDCOVER Student 3rd Edition / Mint condition / Never been read / ISBN-10: 0471739065 / Shipped out in one business day with free tracking. / Shipped out in one business day with free tracking.
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Semiconductor Material and Device Characterization 3e
by Dieter K. Schroder
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Exeter, Devon, United Kingdom
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IEEE, 2006. Hardcover. New. 3rd edition. 779 pages. 9.25x6.25x1.50 inches.
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Semiconductor Material and Device Characterization
by Dieter K. Schroder
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- New
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- Hardcover
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Woodside, New York, United States
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John Wiley & Sons , pp. 800 Index 3rd Edition . Hardback. New.
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Semiconductor Material and Device Characterization 3e
by Dieter K. Schroder
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- New
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Exeter, Devon, United Kingdom
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IEEE, 2006. Hardcover. New. 3rd edition. 779 pages. 9.25x6.25x1.50 inches.
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Semiconductor Material and Device Characterization
by Schroder
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- New
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- 9780471739067 / 0471739065
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Victoria, British Columbia, Canada
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Wiley-IEEE Press. New. Special order direct from the distributor
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