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Leakage in Nanometer CMOS Technologies
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Leakage in Nanometer CMOS Technologies Hardcover - 2005 - 2006th Edition

by Siva G. Narendra (Editor); Anantha P. Chandrakasan (Editor)


From the publisher

Readers acquire understanding of why leakage power components are becoming increasingly relevant in CMOS systems that use nanometer scale MOS devices. Leakage current sources at the MOS device level including sub-threshold and different types of tunneling are discussed in detail. The book will cover in detail promising solutions at the device, circuit, and architecture levels of abstraction. Since manifestation of these MOS device leakage components at the full chip level depends considerably on several aspects including the nature of the circuit block, its state, its application workload, and Process/Voltage/Temperature conditions, the sensitivity of the various MOS leakage sources to these conditions are explained from the first principles. Also treated are the resulting effects so the reader understands the effectiveness of leakage power reduction solutions under these different conditions. With case studies supplying real-world examples that reap the benefits of leakage power reduction solutions, the book highlights different device design choices that exist to mitigate increases in the leakage components as technology scales.

First line

Benefits of CMOS technology scaling in the nanometer regime comes with the disruptive consequence of increasing MOS transistor leakages.

Details

  • Title Leakage in Nanometer CMOS Technologies
  • Author Siva G. Narendra (Editor); Anantha P. Chandrakasan (Editor)
  • Binding Hardcover
  • Edition number 2006th
  • Edition 2006
  • Pages 308
  • Volumes 1
  • Language ENG
  • Publisher Springer
  • Date 2005-11-17
  • Illustrated Yes
  • Features Bibliography, Illustrated, Index, Table of Contents
  • ISBN 9780387257372 / 0387257373
  • Weight 1.28 lbs (0.58 kg)
  • Dimensions 9.56 x 6.28 x 0.89 in (24.28 x 15.95 x 2.26 cm)
  • Library of Congress subjects Integrated circuits - Design and construction, Metal oxide semiconductors, Complementary -
  • Library of Congress Catalog Number 2005932184
  • Dewey Decimal Code 621.384
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LEAKAGE IN NANOMETER CMOS TECHNOLOGIES
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LEAKAGE IN NANOMETER CMOS TECHNOLOGIES

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