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Reflection High-Energy Electron Diffraction
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Reflection High-Energy Electron Diffraction Hardcover - 2004

by Ayahiko Ichimiya; Philip I. Cohen


First line

Reflection high-energy electron diffraction (RHEED or R-HEED) is a technique for surface structural analysis that is remarkably simple to implement, requiring at the minimum only an electron gun, a phosphor screen, and a clean surface.

Details

  • Title Reflection High-Energy Electron Diffraction
  • Author Ayahiko Ichimiya; Philip I. Cohen
  • Binding Hardcover
  • Pages 366
  • Volumes 1
  • Language ENG
  • Publisher Cambridge University Press
  • Date 2004-12-13
  • Illustrated Yes
  • Features Bibliography, Illustrated, Index, Table of Contents
  • ISBN 9780521453738 / 0521453739
  • Weight 1.95 lbs (0.88 kg)
  • Dimensions 9.82 x 7.08 x 0.95 in (24.94 x 17.98 x 2.41 cm)
  • Library of Congress subjects Reflection high energy electron diffraction, Thin films - Surfaces - Analysis
  • Library of Congress Catalog Number 2004045180
  • Dewey Decimal Code 530.427
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Reflection High-Energy Electron Diffraction
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Reflection High-Energy Electron Diffraction

by Cohen, Philip I.,Ichimiya, Ayahiko

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Cambridge University Press, 2004-12-13. Hardcover. Very Good. 2.2883 24.8711 17.5167.
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Reflection High-Energy Electron Diffraction
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Reflection High-Energy Electron Diffraction

by Ayahiko Ichimiya/ Philip I. Cohen

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ISBN 10 / ISBN 13
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Reflection High-Energy Electron Diffraction
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Reflection High-Energy Electron Diffraction

by Ichimiya, Ayahiko; Cohen, Philip I

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ISBN 10 / ISBN 13
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Reflection High-Energy Electron Diffraction [Hardcover
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Reflection High-Energy Electron Diffraction [Hardcover

by Ichimiya, Ayahiko and Cohen, Philip I.

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ISBN 10 / ISBN 13
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