Digital Systems Testing and Testable Design Hardcover - 1994
by Miron Abramovici; Melvin A. Breuer; Arthur D. Friedman
From the rear cover
This widely-used textbook provides comprehensive, state-of-the-art coverage of digital systems testing and testable design.
Considered a definitive text in this area, the book includes in-depth discussions of the following topics:
Test generation
Fault modeling for classic and new technologies
Simulation
Fault simulation
Design for testability
Built-in self-test Diagnosis
All topics are covered extensively, from fundamental concepts to advanced techniques.
Successfully used world-wide at leading universities, the book is appropriate for graduate-level and senior-level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field.
Details
- Title Digital Systems Testing and Testable Design
- Author Miron Abramovici; Melvin A. Breuer; Arthur D. Friedman
- Binding Hardcover
- Edition [ Edition: Repri
- Pages 672
- Volumes 1
- Language ENG
- Publisher Wiley-IEEE Press, Hoboken, New Jersey
- Date 1994-09-27
- Illustrated Yes
- Features Bibliography, Illustrated, Index
- ISBN 9780780310629 / 0780310624
- Weight 2.86 lbs (1.30 kg)
- Dimensions 11.28 x 6.86 x 1.42 in (28.65 x 17.42 x 3.61 cm)
- Library of Congress subjects Digital integrated circuits - Design and, Digital integrated circuits - Testing
- Library of Congress Catalog Number 89-25259
- Dewey Decimal Code 621.381
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