Citation-Based Plagiarism Detection: Detecting Disguised and Cross-Language Plagiarism Using Citation Pattern Analysis Paperback - 2014
by Bela Gipp
From the rear cover
Plagiarism is a problem with far-reaching consequences for the sciences. However, even today's best software-based systems can only reliably identify copy&paste plagiarism. Disguised plagiarism forms, including paraphrased text, cross-language plagiarism, as well as structural and idea plagiarism often remain undetected. This weakness of current systems results in a large percentage of scientific plagiarism going undetected. Bela Gipp provides an overview of the state-of-the art in plagiarism detection and an analysis of why these approaches fail to detect disguised plagiarism forms. The author proposes Citation-based Plagiarism Detection to address this shortcoming. Unlike character-based approaches, this approach does not rely on text comparisons alone, but analyzes citation patterns within documents to form a language-independent "semantic fingerprint" for similarity assessment. The practicability of Citation-based Plagiarism Detection was proven by its capability to identify so-far non-machine detectable plagiarism in scientific publications.
Contents
- Current state of plagiarism detection approaches and systems
- Citation-based Plagiarism Detection
Target Groups
- Readers interested in the problem of plagiarism in the sciences
- Faculty and students from all disciplines, but especially computer science
The Author
Bela Gipp is a postdoctoral researcher at the University of California, Berkeley.
Details
- Title Citation-Based Plagiarism Detection: Detecting Disguised and Cross-Language Plagiarism Using Citation Pattern Analysis
- Author Bela Gipp
- Binding Paperback
- Pages 350
- Volumes 1
- Language ENG
- Publisher Springer Vieweg
- Date 2014-07-14
- Illustrated Yes
- Features Illustrated
- ISBN 9783658063931 / 3658063939
- Weight 1.09 lbs (0.49 kg)
- Dimensions 8.27 x 5.83 x 0.84 in (21.01 x 14.81 x 2.13 cm)
-
Themes
- Aspects (Academic): Science/Technology Aspects
- Dewey Decimal Code 005.7
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