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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces Hardcover - 1994

by Dror Sarid


From the publisher

Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

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  • Title Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces
  • Author Dror Sarid
  • Binding Hardcover
  • Edition Rev Sub
  • Pages 288
  • Volumes 1
  • Language ENG
  • Publisher Oxford University Press, USA, New York
  • Date 1994-08-25
  • Illustrated Yes
  • ISBN 9780195092042 / 019509204X
  • Weight 1.5 lbs (0.68 kg)
  • Dimensions 9.63 x 6.45 x 0.87 in (24.46 x 16.38 x 2.21 cm)
  • Library of Congress subjects Surfaces (Physics), Scanning force microscopy
  • Library of Congress Catalog Number 94003081
  • Dewey Decimal Code 502.82
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces

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Oxford University Press, 1994. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,800grams, ISBN:019509204X
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces

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Oxford University Press, 1994. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:019509204X
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Scanning Force Microscopy : With Applications to Electric, Magnetic, and Atomic Forces

Scanning Force Microscopy : With Applications to Electric, Magnetic, and Atomic Forces

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Oxford University Press, Incorporated, 1994. Hardcover. Good. Disclaimer:A copy that has been read, but remains in clean condition. All pages are intact, and the cover is intact. The spine may show signs of wear. Pages can include limited notes and highlighting, and the copy can include previous owner inscriptions. At ThriftBooks, our motto is: Read More, Spend Less.Dust jacket quality is not guaranteed.
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces

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Oxford University Press, 1994. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780195092042
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford...
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series on Optical and Imaging Sciences)

by Sarid, Dror

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U.S.A.: Oxford University Press, 1994 REVISED HARDBACK BOOK IN GOOD TO VERY GOOD CONDITION,BOOK IS SLIGHTLY TWISTED. 2nd Edition. Hardcover. Good.
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford...
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences)

by Dror Sarid

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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces - Oxford Series in Optical and Imaging Sciences - Revised Edition

by Sarid, Dror

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New York: Oxford University Press, 1994. Revised Edition - Third Printing . Hard Back. Very Good/No Dust Jacket. 6 1/4" X 9 1/2. 263 Pages Indexed. Solid book in great condition. High interest and major advances in the technology of scanning force microscopy that have taken place since the 1991 release has made this Revised Edition necessary. The tenth anniversary of Scanning Tunneling Microscopy, celebrated at the Sixth International Conference on Scanning Tunneling Microscopy in Interlaken, Switzerland August 12-16, 1991, with more than one thousand participants, produced three volumes of papers that attest to the ever-growing interest in this technology. As the field of scanning force microscopy has matured, a gradual shift in gears has taken place, from activities involving the development of instruments to their use as probes in a large rainbow of disciplines. Therefore, this new print, which includes all the material contained in the first print, additionally has the latest available list… Read More
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces

Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces

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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford...
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences, 5)

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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford...
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences, 5)

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