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Reliability Physics Symposium: 1998 IEEE International
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Reliability Physics Symposium: 1998 IEEE International Paperback - 1998

by IEEE Aerospace & Electronics Systems Soc; IEEE Electron Devices Society; International Reliability Physics Sympos


From the publisher

This text deals with physical mechanisms that reduce the reliability or performance of integrated circuits and microelectronics. It covers such topics as: advanced semiconductor devices; failure and yield enhancement analysis; device dielectrics; channel hot carriers; and ESD and latchup."

Details

  • Title Reliability Physics Symposium: 1998 IEEE International
  • Author IEEE Aerospace & Electronics Systems Soc; IEEE Electron Devices Society; International Reliability Physics Sympos
  • Binding Paperback
  • Pages 400
  • Volumes 1
  • Language ENG
  • Publisher Institute of Electrical & Electronics Enginee
  • Date May 1998
  • ISBN 9780780344006 / 0780344006
  • Library of Congress Catalog Number 82640313
  • Dewey Decimal Code 621.381