Skip to content

Transmission Electron Microscopy and Diffractometry of Materials
Stock Photo: Cover May Be Different

Transmission Electron Microscopy and Diffractometry of Materials Hardcover - 2009

by Brent Fultz; James M. Howe


First line

Materials are made of atoms.

Details

  • Title Transmission Electron Microscopy and Diffractometry of Materials
  • Author Brent Fultz; James M. Howe
  • Binding Hardcover
  • Edition 3rd
  • Pages 758
  • Volumes 1
  • Language ENG
  • Publisher Springer, Springer
  • Date 2009-11
  • ISBN 9783540738855 / 3540738851
  • Weight 2.6 lbs (1.18 kg)
  • Dimensions 9.3 x 6.4 x 1.3 in (23.62 x 16.26 x 3.30 cm)
  • Library of Congress Catalog Number 2007933070
  • Dewey Decimal Code 620.112
Back to Top

More Copies for Sale

Transmission Electron Microscopy and Diffractometry of Materials
Stock Photo: Cover May Be Different

Transmission Electron Microscopy and Diffractometry of Materials

by Brent Fultz James Howe

  • New
  • Hardcover
Condition
New
Binding
Hardcover
ISBN 10 / ISBN 13
9783540738855 / 3540738851
Quantity Available
1
Seller
Ankara, Turkey
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
$90.00
$5.00 shipping to USA

Show Details

Description:
Transmission Electron Microscopy and Diffractometry of Materials
Item Price
$90.00
$5.00 shipping to USA
Transmission Electron Microscopy and Diffractometry of Materials [Englisch] [Gebundene Ausgabe]...

Show Details

Description:
Springer, Auflage: 3rd ed. 2008. Corr. 2nd printing 2009. Auflage: 3rd ed. 2008. Corr. 2nd printing 2009. Hardcover. 3,3 x 16 x 23,3 cm. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third… Read More
Item Price
$129.96
$21.79 shipping to USA
Transmission Electron Microscopy & Diffractometry of Materials 3/E 2008
Stock Photo: Cover May Be Different

Transmission Electron Microscopy & Diffractometry of Materials 3/E 2008

by Fultz

  • New
  • Hardcover
Condition
New
Binding
Hardcover
ISBN 10 / ISBN 13
9783540738855 / 3540738851
Quantity Available
1
Seller
Houston, Texas, United States
Seller rating:
This seller has earned a 5 of 5 Stars rating from Biblio customers.
Item Price
$289.95
$9.99 shipping to USA

Show Details

Description:
NEW. 100% BRAND NEW US HARDCOVER STUDENT 3rd Edition / shrink wrapped / Mint condition / ISBN-10: 3540738851 / Shipped out by Amazon directly with free tracking.
Item Price
$289.95
$9.99 shipping to USA