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Transmission Electron Microscopy and Diffractometry of Materials
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Transmission Electron Microscopy and Diffractometry of Materials Hardcover - 2009
by Brent Fultz; James M. Howe
First line
Materials are made of atoms.
Details
- Title Transmission Electron Microscopy and Diffractometry of Materials
- Author Brent Fultz; James M. Howe
- Binding Hardcover
- Edition 3rd
- Pages 758
- Volumes 1
- Language ENG
- Publisher Springer, Springer
- Date 2009-11
- ISBN 9783540738855 / 3540738851
- Weight 2.6 lbs (1.18 kg)
- Dimensions 9.3 x 6.4 x 1.3 in (23.62 x 16.26 x 3.30 cm)
- Library of Congress Catalog Number 2007933070
- Dewey Decimal Code 620.112
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Transmission Electron Microscopy and Diffractometry of Materials
by Brent Fultz James Howe
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- Hardcover
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- New
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- Hardcover
- ISBN 10 / ISBN 13
- 9783540738855 / 3540738851
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Transmission Electron Microscopy and Diffractometry of Materials [Englisch] [Gebundene Ausgabe] Brent Fultz (Autor), James Howe (Autor) This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
by Brent Fultz (Autor), James Howe (Autor)
- Used
- Hardcover
- Condition
- Used
- Edition
- Auflage: 3rd ed. 2008. Corr. 2nd printing 2009
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9783540738855 / 3540738851
- Quantity Available
- 1
- Seller
- Item Price
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$129.96$21.79 shipping to USA
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Springer, Auflage: 3rd ed. 2008. Corr. 2nd printing 2009. Auflage: 3rd ed. 2008. Corr. 2nd printing 2009. Hardcover. 3,3 x 16 x 23,3 cm. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third…
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$129.96
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Transmission Electron Microscopy & Diffractometry of Materials 3/E 2008
by Fultz
- New
- Hardcover
- Condition
- New
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9783540738855 / 3540738851
- Quantity Available
- 1
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Houston, Texas, United States
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$289.95$9.99 shipping to USA
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NEW. 100% BRAND NEW US HARDCOVER STUDENT 3rd Edition / shrink wrapped / Mint condition / ISBN-10: 3540738851 / Shipped out by Amazon directly with free tracking.
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