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Infrared Characterization for Microelectronics
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Infrared Characterization for Microelectronics Hardcover - 1999

by Wai Shing Lau


First line

When two or more atoms are bonded together to form a molecule, many different modes of mechanical vibration are possible.

Details

  • Title Infrared Characterization for Microelectronics
  • Author Wai Shing Lau
  • Binding Hardcover
  • Pages 172
  • Volumes 1
  • Language ENG
  • Publisher World Scientific Publishing Company
  • Date September 1999
  • Illustrated Yes
  • Features Bibliography, Dust Cover, Illustrated, Index, Table of Contents
  • ISBN 9789810223526 / 9810223528
  • Weight 0.79 lbs (0.36 kg)
  • Dimensions 8.7 x 6.1 x 0.6 in (22.10 x 15.49 x 1.52 cm)
  • Library of Congress Catalog Number 99044781
  • Dewey Decimal Code 621.381

Media reviews

Citations

  • Scitech Book News, 09/01/2000, Page 137
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INFRARED CHARACTERIZATION FOR MICROELECTRONICS
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INFRARED CHARACTERIZATION FOR MICROELECTRONICS

by Lau, Wai Shing

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Infrared Characterization for Microelectronics
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Infrared Characterization for Microelectronics

by W. S. Lau

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INFRARED CHARACTERIZATION FOR MICROELECTRONICS
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INFRARED CHARACTERIZATION FOR MICROELECTRONICS

by Lau, Wai Shing

  • Used
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  • Hardcover
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Used - Good
Binding
Hardcover
ISBN 10 / ISBN 13
9789810223526 / 9810223528
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INFRARED CHARACTERIZATION FOR MICROELECTRONICS
Stock Photo: Cover May Be Different

INFRARED CHARACTERIZATION FOR MICROELECTRONICS

by Lau, Wai Shing

  • Used
  • Hardcover
Condition
Used: Good
Edition
Illustrated
Binding
Hardcover
ISBN 10 / ISBN 13
9789810223526 / 9810223528
Quantity Available
1
Seller
HOUSTON, Texas, United States
Seller rating:
This seller has earned a 3 of 5 Stars rating from Biblio customers.
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Show Details

Description:
World Scientific Publishing Company, 1999-10-04. Illustrated. hardcover. Used: Good.
Item Price
$73.79
FREE shipping to USA