Home Classification, Parameter Estimation and State Estimation: An Engineering Approach Using MATLAB by Van Der He; de Ridder; Duin (ISBN: 9780470090138)

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Classification, Parameter Estimation and State Estimation: An Engineering Approach Using MATLAB Hardcover - 2004 - 1st Edition

Name: Classification, Parameter Estimation and State Estimation: An Engineering Approach Using MATLAB
Price: 112.63 USD
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Author: van der Heijden, Ferdinand
ISBN: 9780470090138

by Van Der He; de Ridder; Duin

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First line

Engineering disciplines are those fields of research and development that attempt to create products and systems operating in, and dealing with, the real world.

Details

Title Classification, Parameter Estimation and State Estimation: An Engineering Approach Using MATLAB
Author Van Der He; de Ridder; Duin
Binding Hardcover
Edition number 1st
Edition 1
Pages 423
Volumes 1
Language ENG
Publisher John Wiley & Sons
Date November 19, 2004
Illustrated Yes
ISBN 9780470090138 / 0470090138
Weight 1.64 lbs (0.74 kg)
Dimensions 9.2 x 6.34 x 1.13 in (23.37 x 16.10 x 2.87 cm)
Library of Congress subjects Engineering mathematics - Data processing, Estimation theory - Data processing
Library of Congress Catalog Number 2004011561
Dewey Decimal Code 681.2

About the author

F. van der Heijden, Laboratory for Measurement and Instrumentation, Faculty of Electrical Engineering, University of Twente, P.O. Box 217, 7500AE Enschede, The Netherlands

His main research area is in Measurement and Instrumentation at an academic level and covers sensors and micro measurement systems, and image based measurement systems. He has written books, many book chapters and journal articles.

R.P.W. Duin, Pattern Recognition Group, Delft University of Technology, Department of Imaging Sciences & Technology Lorentzeg 1-2628 CD Delft, The Netherlands

His research includes: theory and applications of image processing and pattern recognition, with a special interest in sensors, measurements and measurement accuracy. He also studies the development and use of tools in this area. He has written 6 books (in English and Dutch) and many journal and conference papers and chapters in books. He is a member of Advanced School for Computing and Imaging (ASCI), Dutch Pattern Recognition Society (NVPHBV), International Association for Pattern Recognition (IAPR) and IAPR Technical Committee TC1 (statistical pattern recognition).

D. de Ridder, Pattern Recognition Group, Delft University of Technology, Department of Imaging Sciences & Technology Lorentzeg 1-2628 CD Delft, The Netherlands

He mainly works on methods for mapping high-dimensional measurement sets to low-dimensional representations, suitable for subsequent regression or classification. He works closely with R Duin and has co-written many papers with him.

D.M.J. Tax, Fraunhofer FIRST.IDA, Kekulestr. 7, D-12489, Berlin, Germany

His main research interest is one-class classification. He was the author/co-author of many journal publications

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