Description:
New York, NY, U.S.A.: The Institute of Electrical and Electronic Engineers, Inc., 1997. Ex-Library. Very Good. Hardcover. 1st Edition.. W/full markings and pocket. IEEE CATALOG NUMBER 97CH36120. Will not fit in Flat Rate Priority Mail envelope. USPS Variable Rate applies for Domestic or International. Casebound, Ex-Library Size: 4to.
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AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '97), PROCEEDINGS OF IEEE INTERNATIONAL, 22-25 September 1997, Anaheim, California. Hardcover - 1997
by IEEE
Details
- Title AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '97), PROCEEDINGS OF IEEE INTERNATIONAL, 22-25 September 1997, Anaheim, California.
- Author IEEE
- Binding Hardcover
- Edition 1st Edition
- Publisher The Institute of Electrical and Electronic Engineers, Inc., New York, NY, U.S.A.
- Date 1997
- ISBN 9780780341630
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Stock Photo: Cover May Be Different
AUTOMATIC TESTING CONFERENCE (AUTOTESTCON '97), PROCEEDINGS OF IEEE INTERNATIONAL, 22-25 September 1997, Anaheim, California.
by IEEE
- Used
- very good
- Hardcover
- first
- Condition
- Used - Very Good
- Edition
- 1st Edition.
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780780341630 / 0780341635
- Quantity Available
- 1
- Seller
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NEWARK, Ohio, United States
- Item Price
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$41.00$5.50 shipping to USA
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