Description:
Bellingham, WA, U.S.A.: SPIE PRESS-The International Society for Optical Engineering; Society of Photo Optical, 1987. Ex-Library. Very Good. Paperback. 1st.. With full markings, labels, pocket and stamps, clean text. Minor wear on edges/corners. Automated Inspection and Measurement - Volume 730, Proceedings of SPIE - The International Society for Optical Engineering, 28-30 October 1986, Cambridge, Massachusetts. Size: 4to.
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Automated Inspection and Measurement (Proceedings of Spie) Paperback - 1987
by Chen, Michael J. W. (Editor); Vercruyssen, M.; Luck, Randall L.; Porquet, C.; et.al.
Details
- Title Automated Inspection and Measurement (Proceedings of Spie)
- Author Chen, Michael J. W. (Editor); Vercruyssen, M.; Luck, Randall L.; Porquet, C.; et.al.
- Binding Paperback
- Edition 1st
- Publisher Society of Photo Optical, Bellingham, WA, U.S.A.
- Date 1987-04
- ISBN 9780892527656
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Stock Photo: Cover May Be Different
Automated Inspection and Measurement (Proceedings of Spie)
by Chen, Michael J. W. (Editor); Vercruyssen, M.; Luck, Randall L.; Porquet, C.; et.al.
- Used
- very good
- Paperback
- first
- Condition
- Used - Very Good
- Edition
- 1st.
- Binding
- Paperback
- ISBN 10 / ISBN 13
- 9780892527656 / 089252765X
- Quantity Available
- 1
- Seller
-
NEWARK, Ohio, United States
- Item Price
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$24.00$5.50 shipping to USA
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$24.00
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Stock Photo: Cover May Be Different
Automated Inspection and Measurement (Proceedings of Spie)
by Michael J. W. Chen (Editor)
- Used
- good
- Paperback
- Condition
- Used - Good
- Binding
- Paperback
- ISBN 10 / ISBN 13
- 9780892527656 / 089252765X
- Quantity Available
- 1
- Seller
-
HOUSTON, Texas, United States
- Item Price
-
$39.43FREE shipping to USA
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Description:
Society of Photo Optical, 1987-04-01. Paperback. Good.
Item Price
$39.43
FREE shipping to USA