Das Elektronen-Rastermikroskop. Praktische Ausfuhrung in Zeitschrift fur Technische Physik 19 pp. 407-416, 1938 [FIRST SCANNING ELECTRON MICROSCOPE]

FIRST EDITION OF THE PAPER IN WHICH Von ARDEEN REPORTS ON & DETAILS HIS CONSTRUCTION OF THE "THE FIRST SCANNING ELECTRON MICROSCOPE," (SEM) an invention he had earlier conceived (Collard, The Development of Microbiology, p. 25). In this paper, Von Ardeene "realized in prototype form" the microscope he had earlier theorized (Brown, Pais, and Pippard, Twentieth Century Physics, III, pp. 1588). He "was awarded the Leibniz Medal for the invention of the scanning electron microscope" (Scanning Transmission Electron Microscopy, Aberration-Corrected Imaging in Transmission Electron Microscopy, 2015).

Manfred von Ardenne was a self-educated German physicist and inventor. In the late 1930s, he realized there was great potential in employing a focused electron probe rather than a wide beam. In other words, von Ardenne wanted to use a focused electron probe to scan across specimens.

Toward that end, von Ardenne (in an earlier paper) suggested the development of a Scanning Electron Microscope (SEM) which would form "images based on detecting secondary electrons that are locally generated by a focused scanning electron beam" (Scanning Transmission Electron Microscopy).

In construction of the prototype he details here, Von Ardeene "incorporate[d] a demagnifying lens system... The height of the optical column of this instrument was about 2 m, and a small electron probe with a diameter of 4 nm was produced by a demagnifying lens system compromised of a two-stage electrostatic lens" (SEM Scanning Electron Microscope A to Z, 31). CONDITION: 4to. Ex-libris bearing only a light stamp on the title page. There are no spine marking or other markings inside or out. Bound in black cloth over marbled paper boards; light scuffing at the edges. Nice wide margins. Clean throughout. Very good condition.