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Single Electron Spin Measurements in Submicron Si MOS-FETs: Random Telegraph Signal, Single Electron Spin Resonance
by Ming Xiao
- Used
- Paperback
- Condition
- Used:Good
- ISBN 10
- 3836493756
- ISBN 13
- 9783836493758
- Seller
-
HOUSTON, Texas, United States
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About This Item
VDM Verlag Dr. Müller, 2008-12-18. Paperback. Used:Good.
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Details
- Bookseller
- Ergodebooks (US)
- Bookseller's Inventory #
- DADAX3836493756
- Title
- Single Electron Spin Measurements in Submicron Si MOS-FETs: Random Telegraph Signal, Single Electron Spin Resonance
- Author
- Ming Xiao
- Format/Binding
- Paperback
- Book Condition
- Used:Good
- Quantity Available
- 1
- ISBN 10
- 3836493756
- ISBN 13
- 9783836493758
- Publisher
- VDM Verlag Dr. Müller
- Date Published
- 2008-12-18
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Ergodebooks
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HOUSTON, Texas
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