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Single Electron Spin Measurements in Submicron Si MOS-FETs: Random Telegraph Signal, Single Electron Spin Resonance

Single Electron Spin Measurements in Submicron Si MOS-FETs: Random Telegraph Signal, Single Electron Spin Resonance

Single Electron Spin Measurements in Submicron Si MOS-FETs: Random Telegraph
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Single Electron Spin Measurements in Submicron Si MOS-FETs: Random Telegraph Signal, Single Electron Spin Resonance

by Ming Xiao

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  • Paperback
Condition
Used:Good
ISBN 10
3836493756
ISBN 13
9783836493758
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About This Item

VDM Verlag Dr. Müller, 2008-12-18. Paperback. Used:Good.

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Bookseller
Ergodebooks US (US)
Bookseller's Inventory #
DADAX3836493756
Title
Single Electron Spin Measurements in Submicron Si MOS-FETs: Random Telegraph Signal, Single Electron Spin Resonance
Author
Ming Xiao
Format/Binding
Paperback
Book Condition
Used:Good
Quantity Available
1
ISBN 10
3836493756
ISBN 13
9783836493758
Publisher
VDM Verlag Dr. Müller
Date Published
2008-12-18

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Ergodebooks

Seller rating:
This seller has earned a 4 of 5 Stars rating from Biblio customers.
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HOUSTON, Texas

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