Skip to content

Perspectives of Fullerene Nanotechnology

Perspectives of Fullerene Nanotechnology

Perspectives of Fullerene Nanotechnology
Stock Photo: Cover May Be Different

Perspectives of Fullerene Nanotechnology

by Osawa, Eiji [Editor]

  • New
  • Hardcover
Condition
New
ISBN 10
0792371747
ISBN 13
9780792371748
Seller
Seller rating:
This seller has earned a 2 of 5 Stars rating from Biblio customers.
campbelltown, Florida, United States
5 Copies Available from This Seller
(You can add more at checkout.)
Item Price
$222.00
Or just $202.00 with a
Bibliophiles Club Membership
$10.00 Shipping to USA
Standard delivery: 13 to 14 days

More Shipping Options

Payment Methods Accepted

  • Visa
  • Mastercard
  • American Express
  • Discover
  • PayPal

About This Item

Springer. Hardcover. New. 9x6x0.

Reviews

(Log in or Create an Account first!)

You’re rating the book as a work, not the seller or the specific copy you purchased!

Details

Bookseller
SOUTHAUSTRALIANBOOKS US (US)
Bookseller's Inventory #
STOCK01549993
Title
Perspectives of Fullerene Nanotechnology
Author
Osawa, Eiji [Editor]
Format/Binding
Hardcover
Book Condition
New New
Quantity Available
5
ISBN 10
0792371747
ISBN 13
9780792371748
Publisher
Springer
This edition first published
January 17, 2002
Size
9x6x0
X weight
26 oz

Terms of Sale

SOUTHAUSTRALIANBOOKS

30 day return guarantee, with full refund including original shipping costs for up to 30 days after delivery if an item arrives misdescribed or damaged.

About the Seller

SOUTHAUSTRALIANBOOKS

Seller rating:
This seller has earned a 2 of 5 Stars rating from Biblio customers.
Biblio member since 2022
campbelltown, Florida

About SOUTHAUSTRALIANBOOKS

Australia Books Dealer.
Ships through Australia Post. Delivery within Australia within 4-5 working days.
International delivery within 10-12 working days

Glossary

Some terminology that may be used in this description includes:

New
A new book is a book previously not circulated to a buyer. Although a new book is typically free of any faults or defects, "new"...
tracking-